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New Phase Microscopy for Advanced Soft Materials Imaging Using Tunable Boersch Electrostatic Phase Plate

Published online by Cambridge University Press:  23 November 2012

F. Chen
F. Chen*
Affiliation:
Engineering and System Science, National Tsing Hua University, Hsin Chu, Taiwan, Taiwan
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 470 - 471
Copyright
Copyright © Microscopy Society of America 2012

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