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A New Paradigm for Ultra-High-Resolution Imaging at Elevated Temperatures

Published online by Cambridge University Press:  03 August 2008

LF Allard
Affiliation:
Oak Ridge National Laboratory
WC Bigelow
Affiliation:
University of Michigan
D Nackashi
Affiliation:
Protochips Inc
J Damiano
Affiliation:
Protochips Inc
SE Mick
Affiliation:
Protochips Inc
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Copyright
© 2008 Microscopy Society of America

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