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A New Approach for Electron Tomography: ADF-TEM

Published online by Cambridge University Press:  01 August 2004

S. Bals ,
V. Radmilovic ,
Q. Yang  and
C. Kisielowski
S. Bals
Affiliation:
National Center for Electron Microscopy, Berkeley, California
V. Radmilovic
Affiliation:
National Center for Electron Microscopy, Berkeley, California
Q. Yang
Affiliation:
National Center for Electron Microscopy, Berkeley, California
C. Kisielowski
Affiliation:
National Center for Electron Microscopy, Berkeley, California
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Extract

Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S03 , August 2004 , pp. 52 - 53
Copyright
© 2004 Microscopy Society of America

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