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Nanoscale Visualization of Phase Transition in Melting of Sn–Bi Particles by In situ Hard X-ray Ptychographic Coherent Diffraction Imaging

Published online by Cambridge University Press:  28 August 2020

Nozomu Ishiguro Open the ORCID record for Nozomu Ishiguro [Opens in a new window] ,
Takaya Higashino ,
Makoto Hirose  and
Yukio Takahashi Open the ORCID record for Yukio Takahashi [Opens in a new window]
Nozomu Ishiguro
Affiliation:
Tohoku University, Institute of Multidisciplinary Research for Advanced Materials (IMRAM)2-1-1, Katahira, Aoba-ku, Sendai980-0857, Miyagi, Japan RIKEN SPring-8 Center, 1-1-1, Kouto, Sayo-cho, Sayo, Hyogo679-5148, Japan
Takaya Higashino
Affiliation:
RIKEN SPring-8 Center, 1-1-1, Kouto, Sayo-cho, Sayo, Hyogo679-5148, Japan Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka565-0871, Japan
Makoto Hirose
Affiliation:
RIKEN SPring-8 Center, 1-1-1, Kouto, Sayo-cho, Sayo, Hyogo679-5148, Japan Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka565-0871, Japan
Yukio Takahashi*
Affiliation:
Tohoku University, Institute of Multidisciplinary Research for Advanced Materials (IMRAM)2-1-1, Katahira, Aoba-ku, Sendai980-0857, Miyagi, Japan RIKEN SPring-8 Center, 1-1-1, Kouto, Sayo-cho, Sayo, Hyogo679-5148, Japan Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka565-0871, Japan Tohoku University, International Center for Synchrotron Radiation Innovation Smart (SRIS)2-1-1, Katahira, Aoba-ku, Sendai980-0857, Miyagi, Japan
*
*Author for correspondence: Yukio Takahashi, E-mail: [email protected]
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Abstract

The phase transition in the melting of Sn–Bi eutectic solder alloy particles was observed by in situ hard X-ray ptychographic coherent diffraction imaging with a pin-point heating system. Ptychographic diffraction patterns of micrometer-sized Sn–Bi particles were collected at temperatures from room temperature to 540 K. The projection images of each particle were reconstructed at a spatial resolution of 25 nm, showing differences in the phase shifts due to two crystal phases in the Sn–Bi alloy system and the Sn/Bi oxides at the surface. By quantitatively evaluating the Bi content, it became clear that the nonuniformity of the composition of Sn and Bi at the single-particle level exists when the particles are synthesized by centrifugal atomization.

Keywords

Eutectic solderIn situ observationPtychographic coherent diffraction imagingSn–Bi alloy
Type
Materials Science Applications
Information
Microscopy and Microanalysis , Volume 26 , Issue 5 , October 2020 , pp. 878 - 885
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Copyright
Copyright © Microscopy Society of America 2020

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Footnotes

a

Nozomu Ishiguro and Takaya Higashino contributed equally to this work.

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