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A multi-technique approach to understand radiation-tolerant nanostructures

Published online by Cambridge University Press:  23 November 2012

C. Parish
Affiliation:
ORNL, Oak Ridge, TN
L. Yao
Affiliation:
ORNL, Oak Ridge, TN
Y. Zhang
Affiliation:
ORNL, Oak Ridge, TN
M. Miller
Affiliation:
ORNL, Oak Ridge, TN
P. Edmondson
Affiliation:
University of Oxford, Oxford, Oxford, United Kingdom
A. Hallén
Affiliation:
Royal Institute of Technology, Kista, Sweden
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2012

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