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Molecular Depth Profiling to 3D Molecular Imaging with XPS and TOF-SIMS

Published online by Cambridge University Press:  03 August 2008

JS Hammond ,
GL Fisher ,
S Raman  and
JF Moulder
JS Hammond
Affiliation:
Physical Electronics
GL Fisher
Affiliation:
Physical Electronics
S Raman
Affiliation:
Physical Electronics
JF Moulder
Affiliation:
Physical Electronics
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 466 - 467
Copyright
© 2008 Microscopy Society of America

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