Hostname: page-component-cd9895bd7-q99xh Total loading time: 0 Render date: 2024-12-24T18:26:54.010Z Has data issue: false hasContentIssue false
  • English
  • Français

Modeling Rectangular Cantilevers during Torsion and Deflection for Application to Frictional Force Microscopy

Published online by Cambridge University Press:  22 May 2009

Victor C. Hayden  and
Luc Y. Beaulieu
Victor C. Hayden
Affiliation:
Department of Physics and Physical Oceanography, Memorial University of Newfoundland, St. John's Newfoundland, Canada
Luc Y. Beaulieu*
Affiliation:
Department of Physics and Physical Oceanography, Memorial University of Newfoundland, St. John's Newfoundland, Canada
*
Corresponding author. E-mail: [email protected]
Get access

Abstract

A numerical and experimental analysis of the optical beam deflection system used to monitor microcantilevers subjected to simultaneous deflection and twisting such as in lateral or frictional force microscopy was performed. This study focused on two optical beam deflection orientations where in the first case the optical beam and the detector are at a right angle to the length of the cantilever and the second case, which is the more standard orientation, the optical beam is parallel to the length of the lever. This study finds that it is possible to model the twist and the deflection separately and treat each motion independently. Simulations have shown that the above-mentioned systems are equivalent in accuracy and sensitivity for monitoring the simultaneous twist and deflection of cantilevers.

Keywords

frictional force microscopylateral force microscopyatomic force microscopymicrocantileversnumerical modeling
Type
Atomic Force Microscopy
Information
Microscopy and Microanalysis , Volume 15 , Issue 3 , June 2009 , pp. 259 - 264
Copyright
Copyright © Microscopy Society of America 2009

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Beaulieu, L.Y., Godin, M., Laroche, O., Tabard-Cossa, V. & Grütter, P. (2006). Calibrating laser beam deflection systems for use in atomic force microscopes and cantilever sensors. Appl Phys Lett 88, 083108.CrossRefGoogle Scholar
Beaulieu, L.Y., Godin, M., Laroche, O., Tabard-Cossa, V. & Grütter, P. (2007). A complete analysis of the laser beam deflection systems used in cantilever-based systems. Ultramicroscopy 107, 422–430.CrossRefGoogle ScholarPubMed
Binnig, G., Quate, C.F. & Gerber, C. (1986). Atomic force microscope. Phys Rev Lett 56, 930–933.CrossRefGoogle ScholarPubMed
Godin, M., Laroche, O., Tabard-Cossa, V., Beaulieu, L.Y., Grütter, P. & Williams, P.J. (2003). Combined in situ micromechanical cantilever-based sensing and ellipsometry. Rev Sci Instrum 74, 4902–4907.CrossRefGoogle Scholar
Goto, M., Kasahara, A., Konishi, Y., Oishi, T., Tosa, M. & Yoshihara, K. (2003). Frictional property of zinc oxide coating films observed by lateral force microscopy. Jpn J Appl Phys 42, 4834–4836.CrossRefGoogle Scholar
Lantz, M.A., O'Shea, S.J., Hoole, A.C.F. & Welland, M.E. (1997). Lateral stiffness of the tip and tip-sample contact in frictional force microscopy. Appl Phys Lett 70, 970–972.CrossRefGoogle Scholar
Mate, C.M. (1995). Force microscopy studies of the molecular origins of friction and lubrication. IBM J Res Develop 39, 617–627.CrossRefGoogle Scholar
Mate, C.M., McClelland, G.M., Erlandsson, R. & Chiang, S. (1987). Atomic-scale friction of a tungsten tip on a graphite surface. Phys Rev Lett 59, 1942–1945.CrossRefGoogle ScholarPubMed
Meyer, G. & Amer, N.M. (1988). Novel optical approach to atomic force microscopy. Appl Phys Lett 53, 1045–1047.CrossRefGoogle Scholar
Meyer, G. & Amer, N.M. (1990). Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope. Appl Phys Lett 57, 2089–2091.CrossRefGoogle Scholar
Ogletree, F., Carpick, R.W. & Salmeron, M. (1996). Calibration of frictional forces in atomic force microscopy. Rev Sci Instrum 67, 3298–3306.CrossRefGoogle Scholar
Reissner, E. & Stein, M. (1951). Torsion and transverse bending of cantilever plates. Langley Research Center, NACA Technical Note 2369.Google Scholar
Ruan, J.A. & Bhushan, B. (1994). Atomic-scale friction measurements using friction force microscopy: Part I—General principles and new measurement techniques. J Tribol Trans ASME 116, 378–388.CrossRefGoogle Scholar
Sarid, D. (1994). Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces. New York: Oxford University Press USA.CrossRefGoogle Scholar
Tocha, E., Schönherr, H. & Vancso, G.J. (2006). Quantitative nanotribology by AFM: A novel universal calibration platform. Langmuir 22, 2340–2350.CrossRefGoogle Scholar
Varenberg, M., Etsion, I. & Halperin, G. (2003). An improved wedge calibration method for lateral force in atomic force microscopy. Rev Sci Instrum 74, 3362–3367.CrossRefGoogle Scholar
Yacoot, A., Koenders, L. & Wolff, H. (2007). An atomic force microscope for the study of tip-sample interactions. Meas Sci Technol 18, 350–359.CrossRefGoogle Scholar