Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-26T14:33:03.977Z Has data issue: false hasContentIssue false
  • English
  • Français

Mitigation of Localized Charging Induced in Insulating Materials by a Focused Ion Beam

Published online by Cambridge University Press:  01 August 2004

Marion A. Stevens-Kalceff  and
Katie J. Levick
Marion A. Stevens-Kalceff
Affiliation:
University of New South Wales, Australia
Katie J. Levick
Affiliation:
University of New South Wales, Australia
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 1116 - 1117
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)