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Misfit relaxation in SrTiO3/SrRuO3 bilayer films on LaA1O3(100) substrates

Published online by Cambridge University Press:  02 July 2020

J.S. Wu ,
C.L. Jia ,
K. Urban ,
J.H. Hao  and
X.X. Xi
J.S. Wu
Affiliation:
Institut für Festkörperforschung, Forschungszentrum Jülich GmbH, D-52425 Jülich, Germany
C.L. Jia
Affiliation:
Institut für Festkörperforschung, Forschungszentrum Jülich GmbH, D-52425 Jülich, Germany
K. Urban
Affiliation:
Institut für Festkörperforschung, Forschungszentrum Jülich GmbH, D-52425 Jülich, Germany
J.H. Hao
Affiliation:
Department of Physics, The Penn. State University, University Park, Pennsylvania, 16802, USA
X.X. Xi
Affiliation:
Department of Physics, The Penn. State University, University Park, Pennsylvania, 16802, USA
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Abstract

Besides perfect dislocations, partial dislocations were proposed as effective means for misfit relaxation in the heretostructure system [1]. The microstructure of SrRuO3 films on SrTiO3 and LaA1O3 substrates have been studied. While misfit dislocations could be hardly found at the SrTiO3/SrRuO3 interface [2], high density of defects was observed in the SrRuO3/LaA1O3 interfaces [3]. in this paper, we report the high-resolution electron microscopy study of the SrTiO3/SrRuO3 bilayer films on (100) LaA1O3 substrates. The emphasis is focused on the means of misfit relaxation at the two interfaces.

Figure 1(a) is a low magnification cross-sectional image of a two-layer SrTiO3/SrRuO3 film on LaA1O3 taken along the [110] direction of the substrate. A high density of defects were observed along the SrRuO3/LaA1O3 interface. Figure 1(b) is a quarter of a superposed electron diffraction pattern (EDP) from the SrTiO3/SrRuO3 interface area, while fig. 1(c) is from the SrRuO3/LaA1O3 interface area.

Type
Thin Films & Coatings
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 1222 - 1223
Copyright
Copyright © Microscopy Society of America 2001

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References

References:

1.Matthews, J.W., in Dislocations in Solids, Chap. 7, edit by F.R.N. Nabarro, (North-Holland, Amesterdam, 1979).Google Scholar
2.Jiang, J.C., et al., Appl. Phys. Lett., 72 (1998) 909.CrossRefGoogle Scholar
3.Lu, P., Chu, F., Jia, Q.X., and Mitchell, T.E., J. Mater. Res., 13 (1998) 2302.CrossRefGoogle Scholar
4.Wu, J.S., et al., to be submitted.Google Scholar
5.Wu, J.S., et al., Phil. Mag. Lett., in press.Google Scholar
6.Wu, J.S. thanks the Alexander von Humboldt-foundation for a research grant.Google Scholar