No CrossRef data available.
Article contents
Lorentz TEM Investigation of Magnetic Domains in Epitaxial C-Axis Oriented Co-Cr Thin Films
Published online by Cambridge University Press: 02 July 2020
Extract
Continuous increase in recording densities of the Co-based longitudinal media requires a drastic scaling down of the grain size in order to keep the required signal to noise ratio. However, this approach to increase the areal density will collapse when the grain size reaches the superparamagnetic limit. As an alternative, based on the analysis of the demagnetization mechanisms, Iwasaki and Takemura suggested the possibility of perpendicular magnetic recording (PMR), and computer simulation, predict areal densities of more than 300Gbit/in for this configuration. The c-axis oriented Co-based hep alloys with the magnetocrystaline anisotropy larger than the demagnetizing energy, are good candidates for the PMR media. However, before this type of materials can be realized, the magnetic domain structure must be well characterized. In this paper detailed analyses of the characteristics and shape of the magnetic domains present in the c-axis oriented CoCr films with thickness relevant for the recording industry are discussed.
- Type
- Films and Coatings
- Information
- Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 446 - 447
- Copyright
- Copyright © Microscopy Society of America
References
1. Iwasaki, S.I. and Takemura, , IEEE Tram. Magn. MAG-11 (1975) 1173CrossRefGoogle Scholar
2. Nakamura, Y., J. MangSoc. Jpn. 15 (1991)497Google Scholar
3. Krishnan, K.M., et al, Appl. Phys. Lett. 64 (1994) 1499CrossRefGoogle Scholar
4. Kusinski, G., et al., Proceedings of The 44th Annual MMM Conference and to be published in J. Appl. Phys. (2000)Google Scholar
5. Chapman, J.N., Ploessl, R., Donnet, D.M., Ultramicroscopy. 47 (1992) 331CrossRefGoogle Scholar
6. Daykin, A.C., Petford-Long, A.K., Ultramicroscopy 58 (1995) 36CrossRefGoogle Scholar
7. Egerton, R.F.“Electron Energy-Loss Spectroscopy in the Electron Microscope”, Plenum Press, New York (1996)CrossRefGoogle Scholar
8. Kooy, C. and Enz, U., Philips Res. Rep. 15 (1960) 7Google Scholar
9. Verbist, K., et al., Proceedings of ICEM 14 (1998) 503Google Scholar
10. Gehanno, V., et al., Phys. Rev. B 55 (1997) 12552CrossRefGoogle Scholar
11. Greg Kusinski acknowledges; IBM financial support through the “IBM Research Fellowship”, research guidance from Prof. Gareth Thomas and Dr. Kannan Krishnan, and technical help from Chris Nelson, John Turner, Doreen Ah Tye and Chung Yu Song. Work at NCEM was supported by the Director, Office of Energy Research, Office of Basic Energy Sciences, Materials Sciences Division of the U.S. Department of Energy under contract No. DE-AC03-76SF00098.Google Scholar