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Locally Condensed Water as a Solution for In Situ Wet Corrosion Electron Microscopy

Published online by Cambridge University Press:  13 February 2020

Majid Ahmadi Open the ORCID record for Majid Ahmadi [Opens in a new window] ,
Frans D. Tichelaar ,
Andreas Ihring ,
Michael Kunze ,
Sophie Billat ,
Zahra Kolahdouz Esfahani  and
Henny W. Zandbergen
Majid Ahmadi*
Affiliation:
Kavli Institute of Nanoscience, Faculty of Applied Sciences, Delft University of Technology, 2628 CJDelft, The Netherlands
Frans D. Tichelaar
Affiliation:
Kavli Institute of Nanoscience, Faculty of Applied Sciences, Delft University of Technology, 2628 CJDelft, The Netherlands
Andreas Ihring
Affiliation:
Leibniz-IPHT, Leibniz Institut für Photonische Technologien e.V., Albert-Einstein-Str. 9, 07745Jena, Germany
Michael Kunze
Affiliation:
HSG-IMIT-Institut für Mikro-und Informationstechnik der Hahn-Schickard-Gesellschaft e.V., Wilhelm-Schickard-Str. 10, 78052Villingen-Schwenningen, Germany
Sophie Billat
Affiliation:
HSG-IMIT-Institut für Mikro-und Informationstechnik der Hahn-Schickard-Gesellschaft e.V., Wilhelm-Schickard-Str. 10, 78052Villingen-Schwenningen, Germany
Zahra Kolahdouz Esfahani
Affiliation:
Kavli Institute of Nanoscience, Faculty of Applied Sciences, Delft University of Technology, 2628 CJDelft, The Netherlands
Henny W. Zandbergen
Affiliation:
Kavli Institute of Nanoscience, Faculty of Applied Sciences, Delft University of Technology, 2628 CJDelft, The Netherlands
*
*Author for correspondence: Majid Ahmadi, E-mail: [email protected]
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Abstract

In microstructural corrosion studies, knowledge on the initiation of corrosion on an nm-scale is lacking. In situ transmission electron microscope (TEM) studies can elucidate where/how the corrosion starts, provided that the proper corrosive conditions are present during the investigation. In wet corrosion studies with liquid cell nanoreactors (NRs), the liquid along the electron beam direction leads to strong scattering and therefore image blurring. Thus, a quick liquid removal or thickness control of the liquid layer is preferred. This can be done by the use of a Peltier element embedded in an NR. As a prelude to such in situ work, we demonstrate the local wetting of a TEM sample, by creating a temperature decrease of 10 ± 2°C on the membrane of an NR with planar Sb/BiSb thermoelectric materials for the Peltier element. TEM samples were prepared and loaded in an NR using a dual-beam focused ion beam scanning electron microscope. A mixture of water vapor and carrier gas was passed through a chamber, which holds the micro-electromechanical system Peltier device and resulted in quick formation of a water layer/droplets on the sample. The TEM analysis after repeated corrosion of the same sample (ex situ studies) shows the onset and progression of O2 and H2S corrosion of the AA2024-T3 alloy and cold-rolled HCT980X steel lamellae.

Keywords

CorrosionIn situ electron microscopyPeltier deviceThermoelectric (TEC) device
Type
Software and Instrumentation
Information
Microscopy and Microanalysis , Volume 26 , Issue 2 , April 2020 , pp. 211 - 219
Copyright
Copyright © Microscopy Society of America 2020

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Footnotes

†

Current Address: Zernike Institute for Advanced Materials, Faculty of Science and Engineering, University of Groningen, 9747 AG Groningen, the Netherlands

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