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Latest Developments in Dynamic TEM: Revealing Material Processes at Nanometer and Nanosecond Scales

Published online by Cambridge University Press:  23 November 2012

B. Reed ,
T. LaGrange ,
M. Santala ,
J. McKeown ,
W. DeHope ,
G. Huete ,
R. Shuttlesworth ,
J. Kim ,
G. Campbell  and
T. Topuria
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B. Reed
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA
T. LaGrange
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA
M. Santala
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA
J. McKeown
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA
W. DeHope
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA
G. Huete
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA
R. Shuttlesworth
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA
J. Kim
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA
G. Campbell
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA
T. Topuria
Affiliation:
IBM Research Division, Almaden Research Center, San Jose, CA
S. Raoux
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, NY
S. Meister
Affiliation:
Stanford University, Stanford, CA
Y. Cui
Affiliation:
Stanford University, Stanford, CA
A. Kilovits
Affiliation:
University of Pittsburgh, Pittsburgh, PA
J. Wiezorek
Affiliation:
University of Pittsburgh, Pittsburgh, PA
L. Nikolova
Affiliation:
Institut National de la Recherche Scientifique, Montreal, Quebec, Canada
J. Kieffer
Affiliation:
Institut National de la Recherche Scientifique, Montreal, Quebec, Canada
F. Rosei
Affiliation:
Institut National de la Recherche Scientifique, Montreal, Quebec, Canada
M. Stern
Affiliation:
McGill University, Montreal, Quebec, Canada
B. Siwick
Affiliation:
McGill University, Montreal, Quebec, Canada
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 596 - 597
Copyright
Copyright © Microscopy Society of America 2012

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