Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-27T03:54:47.076Z Has data issue: false hasContentIssue false

Jump Ratio Elemental Mapping in Amorphous Ice Cryo-EFTEM Opens the Window to Solution Chemistry

Published online by Cambridge University Press:  02 July 2020

J.-O. Bovin
Affiliation:
Chemical Center, Lund University, P.O. Box 124, S-221 00, Lund, Sweden
T. Huber
Affiliation:
Chemical Center, Lund University, P.O. Box 124, S-221 00, Lund, Sweden
O. Balmes
Affiliation:
Chemical Center, Lund University, P.O. Box 124, S-221 00, Lund, Sweden
J.-O. Malm
Affiliation:
Chemical Center, Lund University, P.O. Box 124, S-221 00, Lund, Sweden
G. Karlsson
Affiliation:
National Center for HREM and Biomicroscopy Unit P.O. Box 124, S-221 00, Lund, Sweden
Get access

Extract

The preparation of frozen amorphous thin films of solutions containing crystals, and imaging with cryo energy filtered TEM, opens for the first time the possibility to image the chemistry of solids interacting with liquids. The future possible areas of research include: dynamic of crystal growth processes, adsorption mechanisms, ion exchange, structure determination of solids in equilibrium with solutions, etc.

The sample preparation uses a controlled-environment vitrification system1. Vitrification of the liquid phase was achieved by plunging the grid into liquid ethane. The vitrified specimen was transferred into the microscope by an Oxford CT3500 cryo-holder. The specimen temperature in the microscope column can be kept at -−183 °C. The thickness of the vitrified films, including the crystals, should be about 250 nm or preferably less. The Philips CM120 BioTWIN Cryo, here used for cryo-TEM, has a focal length of 6 mm and a structural resolution of 0.4 nm.

Type
Compositional Imaging and Spectroscopy
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Bellare, JR.et al., ElectronMicrosc. Tech., 10(1988)87.Google Scholar
2.Gubbens, A.J. and Krivanek, O.L.. Ultramicroscopy, 51(1993)146.CrossRefGoogle Scholar
3. This research was supported by NPR and the EU contract ERBFMRXCT980177Google Scholar