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Investigation of radiation effects on the properties of organic semiconductors using low-dose TEM analysis

Published online by Cambridge University Press:  23 November 2012

D.H. Anjum ,
R. Sougrat ,
Z. Kui  and
A. Amassian
D.H. Anjum
Affiliation:
Advanced Nanofabrication, Imaging & Characterization CoreLab, King Abdullah University of Science & Technology, Thuwal, Makkah, Saudi Arabia
R. Sougrat
Affiliation:
Advanced Nanofabrication, Imaging & Characterization CoreLab, King Abdullah University of Science & Technology, Thuwal, Makkah, Saudi Arabia
Z. Kui
Affiliation:
Physical Sciences and Engineering Division, King Abdullah University of Science & Technology, Thuwal, Makkah, Saudi Arabia
A. Amassian
Affiliation:
Physical Sciences and Engineering Division, King Abdullah University of Science & Technology, Thuwal, Makkah, Saudi Arabia
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1436 - 1437
Copyright
Copyright © Microscopy Society of America 2012

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