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Integrated XRF in the SEM

Published online by Cambridge University Press:  01 August 2004

Brian John Cross  and
K C Witherspoon
Brian John Cross
Affiliation:
CrossRoads Scientific, El Grenada, California
K C Witherspoon
Affiliation:
IXRF Systems, Houston, Texas
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 104 - 105
Copyright
© 2004 Microscopy Society of America

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