Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-20T13:30:44.361Z Has data issue: false hasContentIssue false
  • English
  • Français

In-situ and Ex-situ TEM Characterization of Domain Wall-Defect Interactions Using Applied DC Bias in Bismuth Ferrite Thin Films

Published online by Cambridge University Press:  23 November 2012

M. Jablonski ,
C.R. Winkler ,
M.L. Taheri ,
A.R. Damodaran ,
J. Karthik ,
J.G. Wen  and
D.J. Miller
M. Jablonski
Affiliation:
Materials Science and Engineering, Drexel University, Philadelphia, PA
C.R. Winkler
Affiliation:
Materials Science and Engineering, Drexel University, Philadelphia, PA
M.L. Taheri
Affiliation:
Materials Science and Engineering, Drexel University, Philadelphia, PA
A.R. Damodaran
Affiliation:
University of Illinois at Urbana Champaign, Urbana, IL
J. Karthik
Affiliation:
University of Illinois at Urbana Champaign, Urbana, IL
J.G. Wen
Affiliation:
Argonne National Laboratory, Argonne, IL
D.J. Miller
Affiliation:
Argonne National Laboratory, Argonne, IL
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1462 - 1463
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)