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Initial Kinetics of Copper Oxidation in Different Oxidizing Atmospheres as Studied by In Situ UHV-TEM

Published online by Cambridge University Press:  02 July 2020

Mridula D. Bharadwaj ,
Lori Tropia ,
Murray Gibson  and
Judith C. Yang
Mridula D. Bharadwaj
Affiliation:
Department of Materials Science and Engineering, University of Pittsburgh, Pittsburgh, PA15260.
Murray Gibson
Affiliation:
Materials Science Division, Argonne National Laboratories, Argonne, IL60439
Judith C. Yang
Affiliation:
Department of Materials Science and Engineering, University of Pittsburgh, Pittsburgh, PA15260.
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Extract

It is of fundamental and practical interest to understand the oxidation process since a desirable property for metals is resistance to corrosion. But there is a wide gap between information provided by surface science methods and that provided by bulk oxidation studies. The former have mainly examined the adsorption of ∼ 1 ML of oxygen on the metal surface, where as both low and high temperature bulk oxidation studies have mainly focused on the growth of an oxide layer at the later stages of oxidation.

We are probing the initial oxidation stage of a model metal system by in situ ultra-high vacuum (UHV) transmission electron microscopy (TEM) in order to gain insights into the initial kinetics of oxidation. We have previously shown that the growth mechanism of the cuprous oxide is initially dominated by oxygen surface diffision.

Type
Sir John Meurig Thomas Symposium: Microscopy and Microanalysis in the Chemical Sciences
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 42 - 43
Copyright
Copyright © Microscopy Society of America

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References

1.Yang, J.C., Yeadon, M., Kolasa, B. and Gibson, J.M., Appl. Phys. Lett., 70, 26 (1997)Google Scholar
2.Yang, J.C., Yeadon, M., Kolasa, B. and Gibson, J.M., Scripta Materalia, 38, 8 (1998)Google Scholar
3.McDonald, M.L., Gibson, J.M. and Underwald, F.C., Rev. Sci. Instrum. 60, 700 (1989)CrossRefGoogle Scholar
4.Yang, J.C., Yeadon, M., Olynick, D. and Gibson, J.M., Microsc. Microanal. 3, 121 (1997)CrossRefGoogle Scholar
5.Yang, J.C., Kolasa, B. and Gibson, J.M., Appl. Phys. Lett., 73, 19 (1998).Google Scholar
6.Cabrera, N. and Mott, N.F., Rep. Prog. Phys. 12, 163 (1948).CrossRefGoogle Scholar