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Improving the Current Limits of Accuracy in Electron Probe Microanalysis of Geological Materials

Published online by Cambridge University Press:  01 August 2004

John T. Armstrong
John T. Armstrong
Affiliation:
AAES Consulting, Gaithersburg, Maryland
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 94 - 95
Copyright
© 2004 Microscopy Society of America

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