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Imaging Mechanisms in Dynamic Force Microscopy of Polymers

Published online by Cambridge University Press:  02 July 2020

Greg D. Haugstad ,
Jon A. Hammerschmidt  and
Wayne L. Gladfelter
Greg D. Haugstad
Affiliation:
Center for Interfacial Engineering, and Department of Chemistry University of Minnesota, Minneapolis, Minnesota55455, USA
Jon A. Hammerschmidt
Affiliation:
Center for Interfacial Engineering, and Department of Chemistry University of Minnesota, Minneapolis, Minnesota55455, USA
Wayne L. Gladfelter
Affiliation:
Center for Interfacial Engineering, and Department of Chemistry University of Minnesota, Minneapolis, Minnesota55455, USA
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Extract

Applications of scanning force microscopy (SFM) in polymer studies have flourished in this decade, reflecting (a) the power of SFM to image both structure and propertiesdown to the nanometer scale, and (b) the low cost and ease of getting useful results in ambient environments. One difficulty in SFM of polymers has been damage incurred by soft materials during the imaging process. The problem was alleviated by the development of special dynamic modes of operation, in which the probe spends little or no time in contact with the polymer surface. Such modes were dubbed “tapping”, “intermittent-contact”, “non-contact”, “near-contact”, etc. As studies proliferated, it became apparent that different researchers were using different terms to refer to the same apparent imaging mechanism, or the same term to refer to different imaging mechanisms. This quandary derived from a poor understanding of exactly how the SFM probe interacts with the sample surface.1-3,5

Type
Developments In Scanned Probe Microscopy of Polymers
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 990 - 991
Copyright
Copyright © Microscopy Society of America

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References

References:

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