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High-resolution TEM and diffraction study of layer stacking and long-period undulations in the incommensurate misfit layer compound (PbS)1.14NbS2

Published online by Cambridge University Press:  07 September 2007

E Spiecker ,
M Gabrecht ,
C Dieker ,
W Jäger  and
U Dahmen
E Spiecker
Affiliation:
Christian-Albrechts-University,Kiel,Germany and Lawrence Berkeley National Laboratory,USA
M Gabrecht
Affiliation:
Christian-Albrechts-University,Kiel,Germany
C Dieker
Affiliation:
Christian-Albrechts-University,Kiel,Germany
W Jäger
Affiliation:
Christian-Albrechts-University,Kiel,Germany
U Dahmen
Affiliation:
Lawrence Berkeley National Laboratory,USA
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Extract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S03 , September 2007 , pp. 424 - 425
Copyright
Copyright © Microscopy Society of America 2007

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