Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-26T16:36:17.767Z Has data issue: false hasContentIssue false
  • English
  • Français

A High Energy-resolution Wavelength-dispersive Soft-X-ray Spectrometer for a Transmission Electron Microscope to Investigate Valence Electrons

Published online by Cambridge University Press:  01 August 2004

Masami Terauchi
Masami Terauchi
Affiliation:
Tohoku University, Japan
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 1044 - 1045
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)