Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Slater, T J A
Camargo, P H C
Burke, M G
Zaluzec, N J
and
Haigh, S J
2014.
Understanding the limitations of the Super-X energy dispersive x-ray spectrometer as a function of specimen tilt angle for tomographic data acquisition in the S/TEM.
Journal of Physics: Conference Series,
Vol. 522,
Issue. ,
p.
012025.
Zaluzec, Nestor J.
2015.
The influence of C/C correction in analytical imaging and spectroscopy in scanning and transmission electron microscopy.
Ultramicroscopy,
Vol. 151,
Issue. ,
p.
240.
BRODUSCH, NICOLAS
and
GAUVIN, RAYNALD
2017.
The qualitative f‐ratio method applied to electron channelling‐induced x‐ray imaging with an annular silicon drift detector in a scanning electron microscope in the transmission mode.
Journal of Microscopy,
Vol. 267,
Issue. 3,
p.
288.
Muto, Shunsuke
and
Ohtsuka, Masahiro
2017.
High-precision quantitative atomic-site-analysis of functional dopants in crystalline materials by electron-channelling-enhanced microanalysis.
Progress in Crystal Growth and Characterization of Materials,
Vol. 63,
Issue. 2,
p.
40.