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Fully Automatic Registration of Electron Microscopy Images with High and Low Resolution

Published online by Cambridge University Press:  05 August 2007

V Kaynig ,
B Fischer ,
R Wepf  and
JM Buhmann
V Kaynig
Affiliation:
ETH Zurich,Switzerland
B Fischer
Affiliation:
ETH Zurich,Switzerland
R Wepf
Affiliation:
ETH Zurich,Switzerland
JM Buhmann
Affiliation:
ETH Zurich,Switzerland
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 198 - 199
Copyright
© 2007 Microscopy Society of America

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