Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-26T20:20:13.988Z Has data issue: false hasContentIssue false
  • English
  • Français

Fluctuation Microscopy with Electrons or X-Rays: Insight into Medium-Range Order

Published online by Cambridge University Press:  01 August 2004

J. M. Gibson ,
M.M.J. Treacy ,
L. Fan ,
I. McNulty  and
D. Paterson
J. M. Gibson
Affiliation:
Argonne National Laboratory, Argonne, Illinois
M.M.J. Treacy
Affiliation:
Arizona State University
L. Fan
Affiliation:
Argonne National Laboratory, Argonne, Illinois
I. McNulty
Affiliation:
Argonne National Laboratory, Argonne, Illinois
D. Paterson
Affiliation:
Argonne National Laboratory, Argonne, Illinois
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 806 - 807
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)