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Enhanced Quantitative Characterization Of Textured Al-doped ZnO Thin Films Using Plan-view Electron Diffraction

Published online by Cambridge University Press:  23 November 2012

J. Wang
J. Wang*
Affiliation:
School of Physics, Wuhan University, Wuhan, Hubei, China
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1248 - 1249
Copyright
Copyright © Microscopy Society of America 2012

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