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Electron tomography at 2.4 Å resolution

Published online by Cambridge University Press:  23 November 2012

M.C. Scott ,
C.C. Chen ,
M. Mechlenburg ,
C. Zhu ,
R. Xu ,
C. Regan ,
J. Miao ,
P. Ercius  and
U. Dahmen
M.C. Scott
Affiliation:
University of California, Los Angeles, Los Angeles, CA
C.C. Chen
Affiliation:
University of California, Los Angeles, Los Angeles, CA
M. Mechlenburg
Affiliation:
University of California, Los Angeles, Los Angeles, CA
C. Zhu
Affiliation:
University of California, Los Angeles, Los Angeles, CA
R. Xu
Affiliation:
University of California, Los Angeles, Los Angeles, CA
C. Regan
Affiliation:
University of California, Los Angeles, Los Angeles, CA
J. Miao
Affiliation:
University of California, Los Angeles, Los Angeles, CA
P. Ercius
Affiliation:
National Center for Electron Microscopy, Berkeley, CA
U. Dahmen
Affiliation:
National Center for Electron Microscopy, Berkeley, CA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 522 - 523
Copyright
Copyright © Microscopy Society of America 2012

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