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Electron Probe Microanalysis of Bi-Sr-Ca-Cu Superconductors with Transition Metal Substitutions

Published online by Cambridge University Press:  02 July 2020

J.J. McGee ,
J.M. Obien ,
R.R. Wilson  and
J.E. Payne
J.J. McGee
Affiliation:
Department of Geological Sciences, University of South Carolina, Columbia, SC29208
J.M. Obien
Affiliation:
Department of Physical Sciences, South Carolina State University, Orangeburg, SC29117
R.R. Wilson
Affiliation:
Department of Physical Sciences, South Carolina State University, Orangeburg, SC29117
J.E. Payne
Affiliation:
Department of Physical Sciences, South Carolina State University, Orangeburg, SC29117
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Extract

Electron probe microanalysis (EPMA) is being utilized to characterize the composition of superconductors in the Bi-Sr-Ca-Cu-O system (BSCCO) that are doped with minor amounts of transition metal s. Specifically, the Fe Group (Fe, Ru, Os), the Co Group (Co, Rh, Ir), the Ni Group (Ni, Pd, Pt), the Zn Group (Zn, Cd, Hg), and the other elements in the Cu Group (Ag, Au) can be used as dopants. These first long period ions in their common valence states have similar ionic radii, so only small lattice distortions are expected when other first period ions are substituted for Cu. Our research involves the systematic study of the effect of transition metal substitutions (for Cu) on the properties of the two high temperature superconductors, Bi2Sr2CaCu2O8+δ (2212) and Bi2Sr2Ca2Cu3O10+δ (2223).

Substitution for Cu with transition metal ions enables one to see what effect the changing d and s character of the ions have on the superconducting properties of these compounds.

Type
Mas Celebrates: Fifty Years of Electron Probe Microanalysis
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 576 - 577
Copyright
Copyright © Microscopy Society of America

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References

1.Matsubara, I.et.al, Journal of Crystal Growth 128(1993)719.CrossRefGoogle Scholar
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3. The authors acknowledge support at South Carolina State University under DOE Grant DEFG02- 97ER45630. JJM acknowledges support by the Dept. of Geological Sciences at the University of South Carolina.Google Scholar