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EELS Valence Mapping in Electron Beam Sensitive FeFx/C Nanocomposites

Published online by Cambridge University Press:  05 August 2007

F Cosandey
Affiliation:
Rutgers University
J Al-Sharab
Affiliation:
Rutgers University
G Amatucci
Affiliation:
Rutgers University
J Bentley
Affiliation:
Oak Ridge National Laboratory
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Copyright
© 2007 Microscopy Society of America

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