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EELS Investigations of Reference Niobium Oxides and Anodically Grown Niobium Oxide Layers

Published online by Cambridge University Press:  05 August 2007

D Bach ,
H Störmer ,
R Schneider ,
D Gerthsen  and
W Sigle
D Bach
Affiliation:
Universität Karlsruhe,Germany
H Störmer
Affiliation:
Universität Karlsruhe,Germany
R Schneider
Affiliation:
Universität Karlsruhe,Germany
D Gerthsen
Affiliation:
Universität Karlsruhe,Germany
W Sigle
Affiliation:
Max-Planck-Institut für Metallforschung,Germany
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1274 - 1275
Copyright
© 2007 Microscopy Society of America

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