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EEL Spectrum Imaging of Extended Defects in Diamond Using UHV Enfina in a Dedicated STEM

Published online by Cambridge University Press:  01 August 2004

Uschi Bangert ,
Alan J Harvey ,
Robert Jones ,
C J Fall  and
Adam J Papworth
Uschi Bangert
Affiliation:
UMIST, United Kingdom
Alan J Harvey
Affiliation:
UMIST, United Kingdom
Robert Jones
Affiliation:
University of Exeter, United Kingdom
C J Fall
Affiliation:
University of Exeter, United Kingdom
Adam J Papworth
Affiliation:
University of Liverpool, United Kingdom
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 886 - 887
Copyright
© 2004 Microscopy Society of America

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