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Digital Moiré Analysis of Interface Dislocation Structure Between S-Phase (Al2CuMg) and Al-Based Matrix

Published online by Cambridge University Press:  02 July 2020

V. Radmilovic ,
S. Ratkovic  and
U. Dahmen
V. Radmilovic
Affiliation:
University of Belgrade, Dept. of Physical Metallurgy, P.O. Box 494, 11001, Belgrade, Yugoslavia National Center for Electron Microscopy, UC/LBNL, Berkeley, 94720, CA, USA
S. Ratkovic
Affiliation:
University of Belgrade, Dept. of Physical Metallurgy, P.O. Box 494, 11001, Belgrade, Yugoslavia
U. Dahmen
Affiliation:
National Center for Electron Microscopy, UC/LBNL, Berkeley, 94720, CA, USA
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Extract

Using the moiré technique or the related geometrical phase technique [1,2], lattice displacement fields can be derived from high resolution micrographs by comparison with an undistorted reference lattice. A moiré image gives a magnified view of the distortions in a high resolution image, whether they are due to a distortion of the crystal lattice or result from imaging artifacts. The magnification of a moiré image is determined by the choice of the reference lattice. The closer the reference lattice is to the average lattice period in a high resolution image, the larger the magnification. To first order, both rotations and extensions of the lattice are magnified by the same factor g/Δg, where Δg is the difference between the image lattice and the reference lattice [1]. When the moiré technique is applied to interfaces, care must be taken interpret only patterns from corresponding sets of lattice planes. Thus, the technique gives a good representation of the distortions around a precipitate, but the interpretation of the moiré pattern inside a precipitate or across an interface must be made with caution.

Type
Atomic Structure and Mechanisms at Interfaces in Materials
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 665 - 666
Copyright
Copyright © Microscopy Society of America 1997

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References

1.Hetherington, C.J. and Dahmen, U., Scanning Microscopy Supplement 6, 405 (1992)Google Scholar
2.Hytch, M.J. and Dahmen, U., (1997) to be submitted to UltramicroscopyGoogle Scholar
3.Makin, M.J. and Hudson, B., Phil. Mag. 8, 447 (1963)10.1080/14786436308211145CrossRefGoogle Scholar
4.Radmilovic, V., Thomas, G., Shiflet, G.J., and Starke, E.A., Scripta Met. 23, 1141 (1989)10.1016/0036-9748(89)90315-3CrossRefGoogle Scholar
5. This work was supported by the Director, Office of Basic Energy Sciences, Materials Science Division, US Department of Energy, under contract DE-AC3-76SF00098Google Scholar