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Developments in EBSD Pattern Background Removal, Band Detection and Indexing for Improved Data Quality and Ease of Use

Published online by Cambridge University Press:  23 November 2012

J. Goulden ,
N.H. Schmidt ,
H.U. Singh  and
S.D. Sitzman
J. Goulden
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, Bucks, United Kingdom
N.H. Schmidt
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, Bucks, United Kingdom
H.U. Singh
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, Bucks, United Kingdom
S.D. Sitzman
Affiliation:
Oxford Instruments Inc, Concord, MA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1254 - 1255
Copyright
Copyright © Microscopy Society of America 2012

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