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Development of Polarization Modulation Near-Field Scanning Optical Microscope and its Application to Mapping Defect-Induced Birefringence in SrTiO3 Bicrystals

Published online by Cambridge University Press:  02 July 2020

Julia W. P. Hsu ,
E. B. McDaniel  and
S. C. McClain
Julia W. P. Hsu
Affiliation:
Department of Physics, University of Virginia, Charlottesville, VA, 22901, USA
E. B. McDaniel
Affiliation:
Department of Physics, University of Virginia, Charlottesville, VA, 22901, USA
S. C. McClain
Affiliation:
Department of Physics, University of Virginia, Charlottesville, VA, 22901, USA
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Extract

Photoelastic measurement is a sensitive optical technique to map strain fields in otherwise isotropic materials. To extend this method to the submicron scale, we combine dynamic polarimetry with nearfield scanning optical microscopy (NSOM) and construct a polarization modulation NSOM (PMNSOM). The 670 nm laser light passes first through a linear polarizer (oriented at 90°), and then through a photoelastic modulator (PEM), and finally through a quarter wave plate. The PEM introduces a sinusoidally time varying phase shift δ0sin(2πft) into the +45° polarization component, where the modulation frequency/is the resonant frequency (50 kHz) of the PEM quartz element. The quarter wave plate (oriented at 0°) transforms this elliptically polarized light into linearly polarized light with its orientation varying sinusoidally at the modulation frequency. This polarized light is then coupled into a single-mode optical fiber leading to the NSOM tip.

Type
Scanned Probe Microscopy: Much More Than Just Beautiful Images
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 314 - 315
Copyright
Copyright © Microscopy Society of America

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References

1McDaniel, E. B., McClain, S. C., and Hsu, J. W. P., Appl. Opt. 101(1998)84CrossRefGoogle Scholar
2McDaniel, E. B. et. al., Appl. Phys. Lett. 70(1997)1882CrossRefGoogle Scholar
3McDaniel, E. B. and Hsu, J. W. P., J. Appl. Phys. 81(1997)2488CrossRefGoogle Scholar