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Development of an Ad-Hoc Aberration Auto-tuning Procedure on an Oriented Crystalline Specimen in Aberration-Corrected Scanning Transmission Electron Microscopy: the SIAM Method

Published online by Cambridge University Press:  23 November 2012

M. Watanabe  and
H. Sawada
M. Watanabe
Affiliation:
Dept. of Mater. Sci. & Eng., Lehigh University, Bethlehem, PA
H. Sawada
Affiliation:
JEOL, Tokyo, Japan
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 334 - 335
Copyright
Copyright © Microscopy Society of America 2012

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