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Detectability Limits in EELS by Monte Carlo Simulations

Published online by Cambridge University Press:  23 November 2012

M. Attarian Shandiz ,
R. Gauvin  and
F. Salvat
M. Attarian Shandiz
Affiliation:
McGill University,Department of Materials Engineering, Montreal, Quebec, Canada
R. Gauvin
Affiliation:
McGill University,Department of Materials Engineering, Montreal, Quebec, Canada
F. Salvat
Affiliation:
Universitat de Barcelona,Facultat de Fisica, Barcelona, Spain
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 998 - 999
Copyright
Copyright © Microscopy Society of America 2012

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