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Designer Nanostructures Of Catalysts in the Environmental-HREM

Published online by Cambridge University Press:  02 July 2020

Pratibha L. Gai*
Affiliation:
DuPont Central Research, Experimental Station, Wilmington, DE19880, and University of Delaware.
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Extract

Major advances in the field of in situ environmental high resolution electron microscopy (EHREM) probe selective oxidation catalysis directly on the atomic scale. Dynamic gas-solid surface interactions are studied in real-time and under realistic reaction conditions to unravel atomic level insights into active sites and structure-property relationships in vital chemical and technological processes [1-3]. The recent developments include a pioneering approach with the controlled environmental cell (ECELL) facilities permanently mounted inside the EHREM [2]. Accessories have been added for simultaneous structural and compositional analyses of the reactor contents in real-time, and using atomic resolution imaging with transmission electron diffraction and parallel electron energy loss spectroscopy (PEELS). We are now developing innovative experimental methods that include very high temperature studies and combining in the same instrument facilities for both EHREM and environmental-SEM (ESEM), (EHREM-ESEM), with attractive possibilities for studying the science of selective oxidation catalysis.

Alkane Catalysis, Chlorofluorocarbons and Nanotubes:

In the domain of transition metal based oxides, discoveries of fundamental mechanisms underlying selective catalyzation have come from EHREM studies.

Type
A. Howie Symposium: Celebration of Pioneering Electron Microscopy
Copyright
Copyright © Microscopy Society of America

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References

1.Gai, P.L., ed: In-situ Microscopy in Materials Research, Kluwer Acd. Publishers, 1997.CrossRefGoogle Scholar
2.Boyes, E.D. and Gai, P.L., Ultramicroscopy, 67, 219, 1997; (b) P.L. Gai, Adv. Mat. H), 1259,1998.CrossRefGoogle Scholar
3.Sharma, R., Gai, P.L., Gadjardziska, M., Sincliar, R. and Whitman, L. eds : MRS Proc, vol.404, 1996.Google Scholar
4.Hanna, L.G., Smith, D.L. and Hartmann, I.R. are thanked for expert technical support.Google Scholar