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Defects in Nb-Cr-Ti C15 Laves Phase Alloys

Published online by Cambridge University Press:  02 July 2020

P. G. Kotula ,
C.B. Carter ,
K. C. Chen ,
D. J. Thoma ,
F. Chu  and
T. E. Mitchell
P. G. Kotula
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM, 87545
C.B. Carter
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM, 87545
K. C. Chen
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM, 87545
D. J. Thoma
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM, 87545
F. Chu
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM, 87545
T. E. Mitchell
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM, 87545
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Laves-phase intermetallics are of potential use as high-temperature structural materials. NbCr2-based C15-structured alloys are of particular interest for such applications. The effect of Ti alloying on the microstucture and mechanical properties of such alloys has been investigated and it has been shown that Ti can improve the fracture toughness of the monolithic CI 5 Laves phase8 and dual-phase (bcc and CI 5) alloys. In the Nb-Cr-Ti system, there is a complete solid solution between NbCr2 and TiCr2, with a significant range of solubility of the C15 phase and a large two phase, bcc and C15, region. The initial characterization of the defect structure of an alloy of overall composition Nb10Cr75Ti15 is discussed here.

Nb10Cr75Ti15 was prepared by arc-melting the high-purity elemental metals followed by annealing at 1400°C for 120 h and then cooling at l°C/min. Specimens were prepared for observation in the TEM by cutting 3 mm discs with a coring saw, followed by dimpling and ion milling.

Type
Metals and Alloys
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 536 - 537
Copyright
Copyright © Microscopy Society of America

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