Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-17T16:54:07.174Z Has data issue: false hasContentIssue false
  • English
  • Français

Cs Corrector for Imaging

Published online by Cambridge University Press:  01 August 2004

Hidetaka Sawada ,
Takeshi Tomita ,
Toshikatsu Kaneyama ,
Fumio Hosokawa ,
Mikio Naruse ,
Toshikazu Honda ,
Peter Hartel ,
Max Haider ,
Nobuo Tanaka  and
Crispin J D Hetherington
...Show all authors
Hidetaka Sawada
Affiliation:
JEOL, Japan
Takeshi Tomita
Affiliation:
JEOL, Japan
Toshikatsu Kaneyama
Affiliation:
JEOL, Japan
Fumio Hosokawa
Affiliation:
JEOL, Japan
Mikio Naruse
Affiliation:
JEOL, Japan
Toshikazu Honda
Affiliation:
JEOL, Japan
Peter Hartel
Affiliation:
CEOS, Germany
Max Haider
Affiliation:
CEOS, Germany
Nobuo Tanaka
Affiliation:
Nagoya University, Japan
Crispin J D Hetherington
Affiliation:
University of Oxford, United Kingdom
Ron C Doole
Affiliation:
University of Oxford, United Kingdom
Angus I Kirkland
Affiliation:
University of Oxford, United Kingdom
John L Hutchison
Affiliation:
University of Oxford, United Kingdom
John M Titchmarsh
Affiliation:
University of Oxford, United Kingdom
David J H Cockayne
Affiliation:
University of Oxford, United Kingdom
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 976 - 977
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)