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Compressed Sensing of Scanning Transmission Electron Microscopy (STEM) With Nonrectangular Scans

Published online by Cambridge University Press:  27 December 2018

Xin Li ,
Ondrej Dyck ,
Sergei V. Kalinin  and
Stephen Jesse
Xin Li
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA Department of Industrial Engineering, Florida State University, Tallahassee, FL 32306, USA Department of Statistics, Florida State University, Tallahassee, FL 32306, USA
Ondrej Dyck
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
Sergei V. Kalinin*
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
Stephen Jesse*
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
*
*Authors for correspondence: Sergei V. Kalinin, E-mail: [email protected]; Stephen Jesse, E-mail: [email protected]
*Authors for correspondence: Sergei V. Kalinin, E-mail: [email protected]; Stephen Jesse, E-mail: [email protected]
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Abstract

Scanning transmission electron microscopy (STEM) has become the main stay for materials characterization on atomic level, with applications ranging from visualization of localized and extended defects to mapping order parameter fields. In recent years, attention has focused on the potential of STEM to explore beam induced chemical processes and especially manipulating atomic motion, enabling atom-by-atom fabrication. These applications, as well as traditional imaging of beam sensitive materials, necessitate increasing the dynamic range of STEM in imaging and manipulation modes, and increasing the absolute scanning speed which can be achieved by combining sparse sensing methods with nonrectangular scanning trajectories. Here we have developed a general method for real-time reconstruction of sparsely sampled images from high-speed, noninvasive and diverse scanning pathways, including spiral scan and Lissajous scan. This approach is demonstrated on both the synthetic data and experimental STEM data on the beam sensitive material graphene. This work opens the door for comprehensive investigation and optimal design of dose efficient scanning strategies and real-time adaptive inference and control of e-beam induced atomic fabrication.

Keywords

STEMcompressed sensingimage inpaintingreal-timesprial scanLissajous scannonrectangular scanGPU
Type
Materials Science Applications
Information
Microscopy and Microanalysis , Volume 24 , Issue 6 , December 2018 , pp. 623 - 633
Copyright
© Microscopy Society of America 2018 

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Footnotes

Cite this article: Li X, Dyck O, Kalinin SV and Jesse S (2018) Compressed sensing of scanning transmission electron microscopy (STEM) with nonrectangular scans. Microsc Microanal 24(6), 623–633. doi: 10.1017/S143192761801543X

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