Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-20T07:26:39.302Z Has data issue: false hasContentIssue false
  • English
  • Français

Compositional change of NaCl particles under electron beam irradiation measured by time-resolved X-ray analysis

Published online by Cambridge University Press:  23 November 2012

I. Ohnishi ,
K. Shibuya ,
K. Tachibana ,
J. Yamagata ,
M. Morita ,
T. Watanabe ,
S. Miyazawa ,
H. Takahashi ,
Y. Ohkura  and
Y. Kondo
I. Ohnishi
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
K. Shibuya
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
K. Tachibana
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
J. Yamagata
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
M. Morita
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
T. Watanabe
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
S. Miyazawa
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
H. Takahashi
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Y. Ohkura
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Y. Kondo
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1052 - 1053
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)