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A Comparison of Theoretical and Experimental Cross-Sections for EELS Quantification at 200 kV Incident Electron Energy

Published online by Cambridge University Press:  03 August 2008

Q Jin  and
S Wang
Q Jin
Affiliation:
Micron Technology Inc
S Wang
Affiliation:
Micron Technology Inc
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1410 - 1411
Copyright
© 2008 Microscopy Society of America

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