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Comparison of Simulated and Experimental Order Parameters in FePt—II

Published online by Cambridge University Press:  15 April 2011

Karen L. Torres ,
Richard R. Vanfleet  and
Gregory B. Thompson
Karen L. Torres
Affiliation:
Department of Metallurgical & Materials Engineering, The University of Alabama, 301 7th Avenue, 116 Houser Hall, Tuscaloosa, AL 35487-0202, USA
Richard R. Vanfleet
Affiliation:
Department of Physics and Astronomy, Brigham Young University, N283 ESC, Provo, UT 84602, USA
Gregory B. Thompson*
Affiliation:
Department of Metallurgical & Materials Engineering, The University of Alabama, 301 7th Avenue, 116 Houser Hall, Tuscaloosa, AL 35487-0202, USA
*
Corresponding author. E-mail: [email protected]
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Abstract

Eight FePt thin film specimens of various thicknesses, compositions, and order parameters have been analyzed to determine the robustness and fidelity of multislice simulations in determining the chemical order parameter via electron diffraction (ED). The shape of the simulated curves depends significantly on the orientation and thickness of the specimen. The ED results are compared to kinematical scattering order parameters, from the same films, acquired from synchrotron X-ray diffraction (XRD). For the specimens analyzed with convergent beam electron diffraction conditions, the order parameter closely matched the order parameter as determined by the XRD methodology. However, the specimens analyzed by selected area electron diffraction conditions did not show good agreement. This has been attributed to substrate effects that hindered the ability to accurately quantify the intensity values of the superlattice and fundamental reflections.

Keywords

order parameterelectron diffractionFePtthin films
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 17 , Issue 3 , June 2011 , pp. 403 - 409
Copyright
Copyright © Microscopy Society of America 2011

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References

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