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Comparison of Focused Ion Beam and Conventional Techniques on Tem Specimen Preparation of Metal-Ceramic Interfaces

Published online by Cambridge University Press:  02 July 2020

A. Ramirez de Arellano López ,
W.-A. Chiou  and
K. T. Faber
A. Ramirez de Arellano López
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL, 60208 Departamento de Fisica de la Materia Condensada, Universidad de Sevilla, Seville, Spain
W.-A. Chiou
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL, 60208
K. T. Faber
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL, 60208
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Extract

The results of TEM analyses of materials are critically dependent on the quality of the sample prepared. Although numerous techniques have been developed in the last two decades, differential thinning of inhomogeneous materials remains a serious problem. Recently, focused ion beam (FIB) technique has been introduced for cross-sectional sample preparation for TEM and SEM.

A novel system for depositing a fine-grain (∼ 200 nm) ceramic coating on a metal surface via a patent pending Small-Particle Plasma Spray (SPPS) technique has been developed at the Basic Industry Research Laboratory of Northwestern University. To understand the properties of the coated surface, the ceramic/metal interface and the microstructure of the ceramic coating must be investigated. This paper presents a comparison of the microstructure of an A12O3 coating on a mild steel substrate prepared using conventional and FEB techniques.

Type
Specimen Preparation
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 860 - 861
Copyright
Copyright © Microscopy Society of America

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References

1.P.J. Goodhew, , Thin Foil Preparation for Electron Microscopy: Elsevier (1985) 206.Google Scholar
2.R. Anderson, et al., Specimen Preparation for TEM of Materials, Vol. I, II, III: Materials Research Society (1988, 1990, 1992), and cited references.Google Scholar
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4. ARAL is grateful to the Exchange Program between Northwestern and University of Seville. KTF acknowledges the support of the U.S. DOE's Fossil Energy Technology Center under Cooperative Agreement No. DE-FC21-92MC29061. This research made use of Central Facilities supported by the MRSEC program of the NSF (DMR-9632472) at MRC, Northwestern UniversityGoogle Scholar