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Comparison of Electron Channeling Contrast Imaging (ECCI) and Electron Back Scattered Diffraction (EBSD) using Hitachi SU8000 FE-SEM

Published online by Cambridge University Press:  23 November 2012

S. Kaboli ,
J. Su  and
R. Gauvin
S. Kaboli
Affiliation:
Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
J. Su
Affiliation:
McGill University, Montreal, Quebec, Canada
R. Gauvin
Affiliation:
McGill University, Montreal, Quebec, Canada
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 700 - 701
Copyright
Copyright © Microscopy Society of America 2012

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