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Charging Effects on the Spectral Quality of X-ray Microanalysis Using the Variable Pressure Scanning Electron Microscope

Published online by Cambridge University Press:  05 August 2007

J-F Le Berre ,
G Demopoulos  and
R Gauvin
J-F Le Berre
Affiliation:
McGill Univeristy,Canada
G Demopoulos
Affiliation:
McGill Univeristy,Canada
R Gauvin
Affiliation:
McGill Univeristy,Canada
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1478 - 1479
Copyright
© 2007 Microscopy Society of America

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