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Characterizing Interfacial Fracture Toughness Using AFM

Published online by Cambridge University Press:  02 July 2020

M. Li ,
C.B. Carter ,
M.A. Hillmyer  and
W.W. Gerberich
M. Li
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN55455USA
C.B. Carter
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN55455USA
M.A. Hillmyer
Affiliation:
Department of Chemistry, University of Minnesota, Minneapolis, MN55455USA
W.W. Gerberich
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN55455USA
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Reliability of thin polymer films is strongly dependent on interfacial adhesion. This paper concerns the application of indentation combined with atomic force microscopy (AFM) for the evaluation of polymer-non-polymer adhesion. Interfacial toughness calculations have been made using AFM measurement of geometry of delaminations induced by indentation. Fracture surfaces characterized with AFM are also presented here.

The interface chosen for study is that between polystyrene (PS) and a glass substrate. Spin coating has been used to prepare PS films. PS, dissolved in toluene, was spun onto the soda-lime glass and then dried at 60°C for 3h to remove residual solvent. The thickness of the PS film was approximately 660nm. To enhance the driving force for delamination, poly(methyl methacrylate) (PMMA) overlayers were applied on top of the PS films. The PMMA overlayer, of thickness approximately 1.5 μm, was first solvent cast onto a second glass slide, floated off the glass onto deionized water, and then laid on top of a first glass substrate which had been coated with PS.

Type
Scanned Probe Microscopy
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 722 - 723
Copyright
Copyright © Microscopy Society of America

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References

References:

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5. This research was initially supported by the Center for Intertacial Engineering, which was a NSF ERC. The AFM and IBM Micromechanical Tester are part of the Characterization Facility of the University of Minnesota.Google Scholar