Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-19T14:32:55.708Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization of the Microstructure of Al-rich TiAl-Alloys by Combined TEM Imaging Techniques

Published online by Cambridge University Press:  07 September 2007

K Kelm ,
S Irsen ,
M Paninski ,
A Drevermann ,
G J Schmitz ,
M Palm ,
F Stein ,
N Engberding ,
M Heilmaier  and
H Saage
...Show all authors
K Kelm
Affiliation:
caesar research center,Germany
S Irsen
Affiliation:
caesar research center,Germany
M Paninski
Affiliation:
ACCESS e.V.,Germany
A Drevermann
Affiliation:
ACCESS e.V.,Germany
G J Schmitz
Affiliation:
ACCESS e.V.,Germany
M Palm
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH,Germany
F Stein
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH,Germany
N Engberding
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH,Germany
M Heilmaier
Affiliation:
Otto-von-Guericke-Universität Magdeburg,Germany
H Saage
Affiliation:
Otto-von-Guericke-Universität Magdeburg,Germany
D Sturm
Affiliation:
Otto-von-Guericke-Universität Magdeburg,Germany
Get access

Extract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S03 , September 2007 , pp. 294 - 295
Copyright
Copyright © Microscopy Society of America 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)