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Axiotaxy of CrSi2 on Si(001); from the Micrometer- to the Angstrom-Scale

Published online by Cambridge University Press:  07 September 2007

M Falke ,
H Schletter ,
O Filonenko ,
A Mogilatenko ,
G Beddies ,
S Schulze ,
M Hietschold ,
A Bleloch ,
K De Keyser  and
C Detavernier
M Falke
Affiliation:
University of Technology Chemnitz,Germany
H Schletter
Affiliation:
University of Technology Chemnitz,Germany
O Filonenko
Affiliation:
University of Technology Chemnitz,Germany
A Mogilatenko
Affiliation:
University of Technology Chemnitz,Germany
G Beddies
Affiliation:
University of Technology Chemnitz,Germany
S Schulze
Affiliation:
University of Technology Chemnitz,Germany
M Hietschold
Affiliation:
University of Technology Chemnitz,Germany
A Bleloch
Affiliation:
Daresbury Laboratory of University of Liverpool,U.K.
K De Keyser
Affiliation:
Ghent University,Belgium
C Detavernier
Affiliation:
Ghent University,Belgium
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Extract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S03 , September 2007 , pp. 396 - 397
Copyright
Copyright © Microscopy Society of America 2007

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