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Atomic Resolution In-situ Environmental (Scanning) TEM (ES/TEM) for Probing Gas-Solid Reactions: Applications and Opportunities

Published online by Cambridge University Press:  31 July 2006

PL Gai
PL Gai
Affiliation:
DuPont,University of Delaware
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 48 - 49
Copyright
© 2006 Microscopy Society of America

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