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Atomic Resolution Elemental Maps by Core Level EELS Using Cs Corrected STEM

Published online by Cambridge University Press:  03 August 2008

E Okunishi ,
H Sawada ,
Y Kondo  and
M Kersker
E Okunishi
Affiliation:
JEOL Ltd, Japan
H Sawada
Affiliation:
JEOL Ltd, Japan
Y Kondo
Affiliation:
JEOL Ltd, Japan
M Kersker
Affiliation:
JEOL USA
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1372 - 1373
Copyright
© 2008 Microscopy Society of America

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